Dr. Eschke Elektronik

High Speed Combinational Tester CT300 Meteor

Modular Combinational Test System
Application for Function Test,
In-Circuit Test and MDA

19’’ System with 14 Slots or 21 Slots
Overview

+   Function Test 1GS/s analog

+   Function Test 300 MS/s digital

+   In-Circuit Test, max. 2736 points

+   Handler Control

+   Parallel Test > 2500 parts/s

+   Full Graphic User Interface

+   CAE CAD Converter

+   Extended Statistics

CT300 Meteor

+   Repair Station

 

 Please contact us for further information.

CT300 Series: CT300 Galaxy , CT300 Satellite , CT350 Comet , CT350 Comet R , CT350 Comet T

P r o d u c t s  O v e r v i e w

Reserve technical changes. © Dr. Eschke Elektronik GmbH. All rights reserved.