Dr. Eschke Elektronik

High Speed Combinational Tester CT300 Satellite

Modular Combinational Test System
Application for Function Test,
In-Circuit Test and MDA

19’’ Compact System with 7 Slot
Overview

+   Function Test 1GS/s analog

+   Function Test 300 MS/s digital

+   In-Circuit Test, max. 720 points

 

+   Full Graphic User Interface

+   Repair Station

+   Extended Statistics

+   CAE CAD Converter

+   Parallel Test > 2500 parts/s

+   Handler Control

 
Please
contact us for further information.

 CT300 Series: CT300 Galaxy , CT300 Meteor , CT350 Comet , CT350 Comet R , CT350 Comet T

P r o d u c t s  O v e r v i e w

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