Welcome to

Dr. Eschke Elektronik

Innovative Testing Systems

Development, manufacturing and sale of electronic Testing Systems since 1990.

 In-Circuit- and Functional Testers

 Semiconductor- and  IC Testers    

- Innovative Combinational Test
- 300 MS/s digital, 1 GS/s analog
- Analog Resolution 24 Bit
- Current Resolution 1 nA
- Power up to 10 kW (several V, I)
- Fast Pulse Measurements
- Full-Graphic Functions
- USB2.0-Transmissions between Tester and PC

Board Tester

Component Tester

- Modern High Speed Testers
- Mixed Signal Tests
- Short Test Times, High Throughput
- Modular and compact Systems
- Complete Solutions
- Fast and reliable Support Facility
- Beneficial Price/Performance Ratio

Compact performers in innovative technology.
More than 670 systems are worldwide in use.

Dr. Eschke Elektronik GmbH
Bachstr. 21
D-12623 Berlin
Germany

Phone: +49(0)30-56701669
Fax:     +49(0)30-56701689

High Speed Combinational Tester

> CT300 Satellite
> CT300 Meteor
> CT300 Galaxy
> CT350 Comet
> CT350 Comet S
> CT350 Comet R
> CT350 Comet T - new -
- In-circuit tester, MDA
- Functional test with 300 MS/s
- Analog test with 1 GS/s

Test System CT350 Comet T

News


> Start of cooperation with WG-Test GmbH
   Contract signed by Walter Grandjot and
   Dr. Gert Eschke in August 2010.
 

> Test System CT350 Comet T
> New Tester Operating System “Test OS4”
> Boundary Scan Test Light
> Color Detection Sensor CDS for extended LED-tests
> Tester Module AM30-4
> New Regional Office Germany (Middle Germany)
> Test System CT350 Comet R
> Precision Tester Modules 24 Bit Res.
> Parallel Board-Test
> Import of Teradyne J971TM test vectors

Events

 

 

 

 

 

Nuremberg, 8 - 10 May 2012
Hall 6, Booth 314

Please klick here for an appointment.

 

 

Tester effort

  Germany

  Netherlands

  Austria

  Malta

  Norway

  Slovenia

  Philippines

  Malaysia

  Taiwan

  Japan

  

 

© Dr. Eschke Elektronik GmbH.  All rights reserved.