Application area - Automatic production lines - In-line systems - Single or multisite test - Research and development - Verification of prototypes - Production characterization - Quality assurance and service
 Semiconductor-series production IC multisite test with CT300 Meteor parallel test of 32 chips
Semiconductor-series production Use in German and Austrian international leading companies
Test of CMOS camera modules and image sensors
Measurement Methods, Standard Tests - Contact test - Short-circuit test - Detailed parametric tests - Automatic waveform test - Digital scope function - Analog and digital high-speed tests - Parallel IC programming
Application of the systems for testing small and large series semiconductor manufacturing with controlling various handling systems
CT300 Satellite
Semiconductor Tester
CT300 Meteor for Prototype verification and series production
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