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Innovative Test Systems for Production, Development and Service
In-Circuit Tester Functional Tester Components Tester Inline Tester Semiconductor Tester Boundary Scan Test AOI Tests
News Dipl.-Ing. (FH) Schmieder is managing director Dipl.-Ing. (FH) Ziehnert is head of software development Analog Module AM30-4B, 30 V, 300 mA, 24 bit ODB++ Data Import  Software package “CTestAdvisor” for development and execution of test functions High Voltage Digital Module DM300-32HV, 32 V, 15 MS/s Boundary Scan Test extended with Göpel CASCON Dipl.-Ing. (FH) Sass is Manager Service Cooperation with ATEcare Service GmbH & Co. KG Boundary Scan Test and AOI Test functions
Special Features  Uniform operator software with open system structure  Sampling rates 300, 500 MS/s o. 1GS/s  Programmable levels, frequencies, and delays  Automatic program generator  Teach-in functions  Test coverage analysis, logging and statistic  Replacement for different test- and measurement devices In-circuit Test, Function Test,  Boundary Scan Test, AOI-Test Functions in a single Test System
CT3XX Tester family - what does that mean for you?   Free scalable modular technology   Uniform tester bus system   Uniform tester operating software   Interchangeable modules between all tester types   Tester resources as required              Flexibility and low costs
Our customer requirements determine principle and direction of our tester developments.  Know-how, elaborated over more than 25 years, is used for testing electronic devices, components and IC’s. We deliver test systems and complete test solutions.
CT350 Comet PR
Exhibitions, Appointments     productronica 2017        Munich, 14. - 17. November 2017 Please, click here for an Appointment.
Inline-System at Siemens AG with Dr. Eschke CT300 Meteor Inline-System at Digades with Dr. Eschke CT300 Meteor