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CT300 Satellite Modular combinational tester for functional tests and ICT / MDA
  Function test 1GS/s analog   Function test 300 MS/s digital   ICT test pins: max. 720   Parallel tests   Powerful test operating system   Graphical user interface   Teach-in functions   Panel and multisite test
19’’ Systems with with 7 slots Compact System Footprint W x D x H [cm]:  59 x 30 x 21
  Test coverage analysis   PCB-CAD import   Automatic program generator   Convenient debugging   Paperless repair station   Logging   Statistic   Self test and self adjustment
Coupling the adapter with standard flat cables or with optional High Pin Count Interface (HPC-IF) Controlling of In-line- and handling systems
Reserve technical changes. © Dr. Eschke Elektronik GmbH. All rights reserved.